M. A. THALOR; OMKAR S. GAIKWAD. Facial Recognition Attendance Monitoring System using Deep Learning Techniques. International Journal of Integrated Science and Technology, [S. l.], v. 1, n. 6, p. 841–848, 2024. DOI: 10.59890/ijist.v1i6.685. Disponível em: http://journal.multitechpublisher.com/index.php/ijist/article/view/685. Acesso em: 31 jul. 2026.