M.A THALOR; OMKAR S. GAIKWAD. Facial Recognition Attendance Monitoring System using Deep Learning Techniques. International Journal of Integrated Science and Technology, [S. l.], v. 2, n. 1, p. 45–52, 2024. DOI: 10.59890/ijist.v2i1.1290. Disponível em: https://journal.multitechpublisher.com/index.php/ijist/article/view/1290. Acesso em: 27 may. 2026.